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  1. DFT Digest: Expanding design-for-test in an ever-shring world…

    Design for test, Design-for-Test (DFT) discussion, education, and best-practices, including Scan, ATPG, BIST, Memory BIST, Logic BIST, Test Compression, ...
    test3
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    eda1
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    vlsi1
    dfm1
    dft1
    electronic design automation1
    ic design1
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    testability1
    design for manufacture1
    design for test1
    manufacturability1
    design for testability1
    best-practices1
    atpg1
    design-for-testability1
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    fault coverage1
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    ibist1
    logic bist1
    memory bist1
    nanometer design1
    test compression1

    www.dftdigest.com - 2009-02-08

design7 dft1 isp4 design for manufacturability1 bist1 design for manufacturing1 dfm1 dich1 jtag1 cmp1 jtag interface1 bsdl1

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